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International The Detection and Imaging of Internal Defect Using ESPI-Based strain Analysis   106785
International The Nonlinearity of Guided Wave in an Elastic Plate   102474
International Thermal damages on the surface of a silicon wafer induced by a near-infrared laser   637707
International Ultrasonic Characterization for directional coarsening in nickel-base superalloy during creep exposure   130873
International Ultrasonic Estimation of Clamping Force in High-Tension Bolts   109677
International Ultrasonic nonlinearity parameter in uniaxial stress condition   43016
International Wavelet analysis based deconvolution to improve the resolution of scanning acoustic microscope images for the inspection of thin die layer in semiconductor   134054
International Wetting behavior and nanotribological properties of silicon nanopatterns combined with diamond-like carbon and perfluoropolyther films   109677
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ISNDE Laboratory
203-2,Engineering Center Annex
Hanyang University,
222 Wangsimni-ro, Seongdong-gu
Seoul 04763, Korea
04763 서울특별시 성동구 왕십리로 222
한양대학교 공업센터 별관 203-2호
지능계측 및 비파괴평가 연구실
Tel: 02 - 2220 - 4220
Fax: 02 - 2299 - 7207