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The Detection and Imaging of Internal Defect Using ESPI-Based strain Analysis
Date2012.05.03 CategoryInternational Views106785 -
The Nonlinearity of Guided Wave in an Elastic Plate
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Thermal damages on the surface of a silicon wafer induced by a near-infrared laser
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Ultrasonic Characterization for directional coarsening in nickel-base superalloy during creep exposure
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Ultrasonic nonlinearity parameter in uniaxial stress condition
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Wavelet analysis based deconvolution to improve the resolution of scanning acoustic microscope images for the inspection of thin die layer in semiconductor
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Wetting behavior and nanotribological properties of silicon nanopatterns combined with diamond-like carbon and perfluoropolyther films
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