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  7. Analysis of the influence of surface roughness on measurement of ultrasonic nonlinearity parameter using contact-type transducer

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  8. Thermal damages on the surface of a silicon wafer induced by a near-infrared laser

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ISNDE Laboratory
203-2,Engineering Center Annex
Hanyang University,
222 Wangsimni-ro, Seongdong-gu
Seoul 04763, Korea
04763 서울특별시 성동구 왕십리로 222
한양대학교 공업센터 별관 203-2호
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Tel: 02 - 2220 - 4220
Fax: 02 - 2299 - 7207