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International
The Detection and Imaging of Internal Defect Using ESPI-Based strain Analysis
106785
International
The Nonlinearity of Guided Wave in an Elastic Plate
102478
International
Thermal damages on the surface of a silicon wafer induced by a near-infrared laser
638019
International
Ultrasonic Characterization for directional coarsening in nickel-base superalloy during creep exposure
130898
International
Ultrasonic Estimation of Clamping Force in High-Tension Bolts
109681
International
Ultrasonic nonlinearity parameter in uniaxial stress condition
43076
International
Wavelet analysis based deconvolution to improve the resolution of scanning acoustic microscope images for the inspection of thin die layer in semiconductor
134106
International
Wetting behavior and nanotribological properties of silicon nanopatterns combined with diamond-like carbon and perfluoropolyther films
109677
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ISNDE Laboratory 203-2,Engineering Center Annex Hanyang University, 222 Wangsimni-ro, Seongdong-gu Seoul 04763, Korea
04763 서울특별시 성동구 왕십리로 222 한양대학교 공업센터 별관 203-2호 지능계측 및 비파괴평가 연구실
Tel: 02 - 2220 - 4220 Fax: 02 - 2299 - 7207