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International
Influence of repetitive pulsed laser irradiation on the surface characteristics of an aluminum alloy in the melting regime
226062
International
Real-time detection of surface cracks on silicon wafers during laser beam irradiation
219385
Domestic
High power CW laser-induced damage of CMOS image sensor
97144
Domestic
Measurement of Ultrasonic Nonlinear Parameter by Using Non-Contact Ultrasonic Receiver
96306
Domestic
Study on the Nonlinear Electromagnetic Acoustic Resonance Method for the Evaluation of Hidden Damage in a Metallic Material
95340
International
Influence of laser beam profiles on the frequency bandwidth of laser-generated surface acoustic waves
119133
International
Laser ultrasonic inspection in ablation regime
119974
International
Improvement of Crack Sizing Performance by using Nonlinear Ultrasonic Technique
101294
International
In-Line Ultrasonic Monitoring for Sediments Stuck on Inner Wall of a Polyvinyl Chloride Pipe
122874
International
In situ detection of laser-induced slip initiation on the silicon wafer surface
103354
International
Initiation time of near-infrared laser-induced slip on the surface of silicon wafers
105651
Domestic
Evaluation of Ultrasonic Nonlinear Characteristics in Artificially Aged Al6061-T6
112786
Domestic
Simulations for Internal Defect Inspection using Laser Generated Ultrasonic Wave in Ablation Regime
120973
International
Slip damage of silicon wafers subjected to continuous infrared laser irradiation
104654
International
Thermal damages on the surface of a silicon wafer induced by a near-infrared laser
535306
Domestic
Feasibility of MFC (Macro-Fiber Composite) Transducers for Guided Wave Technique
187226
Domestic
Initial Second Harmonic Generation in Narrowband Surface Waves by Multi-Line Laser Beams for Two Kinds of Spatial Energy Profile Models
124340
Domestic
Evaluation of Ultrasonic Nonlinear Characteristics in Heat-Treated Aluminum Alloy
113657
Domestic
A6061 합금의 석출경화 열처리에 따른 탄성파의 음향 특성 연구
120379
International
Crack Detection in Single-Crystalline Silicon Wafer Using Laser Generated Lamb Wave
120824
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ISNDE Laboratory 203-2,Engineering Center Annex Hanyang University, 222 Wangsimni-ro, Seongdong-gu Seoul 04763, Korea
04763 서울특별시 성동구 왕십리로 222 한양대학교 공업센터 별관 203-2호 지능계측 및 비파괴평가 연구실
Tel: 02 - 2220 - 4220 Fax: 02 - 2299 - 7207