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2015.09.16 15:37
High power CW laser-induced damage of CMOS image sensor
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http://www.dbpia.co.kr/Journal/ArticleDetail/NODE06069135
- 대한기계학회논문집 A권 제39권 제1호, 2015.01, 105-109 (5 pages)
고출력 CW 레이저에 의한 CMOS 영상 센서의 손상 분석
High-Power Continuous-Wave Laser-Induced Damage to Complementary Metal-Oxide Semiconductor Image Sensor
김진겸, 최성호, 윤성희, 장경영, 신완순
한국어 초록
영어 초록-
Study on the Nonlinear Electromagnetic Acoustic Resonance Method for the Evaluation of Hidden Damage in a Metallic Material
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Measurement of Ultrasonic Nonlinear Parameter by Using Non-Contact Ultrasonic Receiver
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High power CW laser-induced damage of CMOS image sensor
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Variation of Acoustoelastic Effect in Al6061-T6 according to Heat Treatment Time
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Imaging and Sizing of Surface Defects Using Synthetic Aperture Focusing of Laser-generated Surface Waves
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Porosity evaluation of additive manufactured parts: ultrasonic testing and eddy current testing